A new built-in self-test approach for digital-to-analog and analog-to-digital converters
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
A Signature Analyzer for Analog and Mixed-signal Circuits
ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
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An accurate and simple method is introduced fordetermining the third order polynomial that best fits a setof data points containing random noise. The coefficientsof the polynomial are translated into offset, gain, andharmonic distortion for an analog-to-digital converter(ADC) driven by a digital-to-analog converter (DAC) orother appropriate signal source. The algorithm is efficientenough to be implemented as a built-in self-test for an IC,and is particularly suitable for sigma-delta converters.