Low Cost BIST for Static and Dynamic Testing of ADCs

Authors:
Maria Gloria Flores;Marcelo Negreiros;Luigi Carro;Altamiro A. Susin;Felipe R. Clayton;Cristiano Benevento
Affiliations:
Departamento de Engenharia Elétrica, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil;Instituto de Informática-PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil;Departamento de Engenharia Elétrica, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil;Departamento de Engenharia Elétrica, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil;Motorola SPS at Brazil Semiconductor Technology Center, BSTC, Jaguariúna, Brazil;Motorola SPS at Brazil Semiconductor Technology Center, BSTC, Jaguariúna, Brazil
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2005

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Abstract

This paper presents a low cost test method for the static and dynamic characterization of analog-to-digital converters. The method is suitable for implementation in a SoC environment, as a built-in self test (BIST) solution. In the proposed approach, noise is used as the test signal. Theory of operation and practical results demonstrating the effectiveness of the method for INL, DNL, THD and SINAD characterization are presented. The BIST surface overhead caused by the noise generator is only 7.4% of the ADC total area. The reduced number of data samples required allows a reduction of about 7.5脳 in test time, in comparison to the histogram method.