A new built-in self-test approach for digital-to-analog and analog-to-digital converters
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
Proceedings of the IEEE International Test Conference
Signal Generation Using Periodic Single-and Multi-Bit Sigma-Delta Modulated Streams
Proceedings of the IEEE International Test Conference
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Efficient and accurate testing of analog-to-digital converters using oscillation-test method
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Built-in self-test methodology for A/D converters
EDTC '97 Proceedings of the 1997 European conference on Design and Test
New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters
Journal of Electronic Testing: Theory and Applications
BIST and production testing of ADCs using imprecise stimulus
ACM Transactions on Design Automation of Electronic Systems (TODAES)
An efficient linearity test for on-chip high speed ADC and DAC using loop-back
Proceedings of the 14th ACM Great Lakes symposium on VLSI
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
A Built-in-Self-Test Scheme for Segmented and Binary Weighted DACs
Journal of Electronic Testing: Theory and Applications
Low Cost BIST for Static and Dynamic Testing of ADCs
Journal of Electronic Testing: Theory and Applications
Delta-sigma modulator based mixed-signal BIST architecture for SoC
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Test infrastructure design for mixed-signal SOCs with wrapped analog cores
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters
Journal of Electronic Testing: Theory and Applications
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST
Journal of Electronic Testing: Theory and Applications
Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits
IEICE - Transactions on Information and Systems
A decorrelating design-for-digital-testability scheme for Σ-Δ modulators
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study
Journal of Electronic Testing: Theory and Applications
A built-in-test circuit for RF differential low noise amplifiers
IEEE Transactions on Circuits and Systems Part I: Regular Papers
A robust ADC code hit counting technique
Proceedings of the Conference on Design, Automation and Test in Europe
A self-testing and calibration method for embedded successive approximation register ADC
Proceedings of the 16th Asia and South Pacific Design Automation Conference
A Design of Linearity Built-in Self-Test for Current-Steering DAC
Journal of Electronic Testing: Theory and Applications
Automatic linearity and frequency response tests with built-in pattern generator and analyzer
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
ΔΣ modulation based on-chip ramp generator for ADC BIST
CONTROL'05 Proceedings of the 2005 WSEAS international conference on Dynamical systems and control
An Output Response Analyzer Circuit for ADC Built-in Self-Test
Journal of Electronic Testing: Theory and Applications
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
An IDDQ-based source driver IC design-for-test technique
Proceedings of the International Conference on Computer-Aided Design
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