A BIST scheme for on-chip ADC and DAC testing
DATE '00 Proceedings of the conference on Design, automation and test in Europe
A sigma-delta modulation based BIST scheme for mixed-signal circuits
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
Embedded software-based self-testing for SoC design
Proceedings of the 39th annual Design Automation Conference
Embedded Software-Based Self-Test for Programmable Core-Based Designs
IEEE Design & Test
A high speed and area efficient on-chip analog waveform extractor
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques
ITC '98 Proceedings of the 1998 IEEE International Test Conference
ON-CHIP MEASUREMENT OF THE JITTER TRANSFER FUNCTION OF CHARGE-PUMP PHASE-LOCKED LOOPS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
BIST for Phase-Locked Loops in Digital Applications
ITC '99 Proceedings of the 1999 IEEE International Test Conference
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
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