Design of multibit noise-shaping data converters
Analog Integrated Circuits and Signal Processing - Special issue on computer-aided design of analog circuits and systems
Metrics, techniques and recent developments in mixed-signal testing
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
A Tutorial on Built-in Self-Test. I. Principles
IEEE Design & Test
An Integration of Memory-Based Analog Signal Generation into Current DFT Architectures
Proceedings of the IEEE International Test Conference on Test and Design Validity
Signal Generation Using Periodic Single-and Multi-Bit Sigma-Delta Modulated Streams
Proceedings of the IEEE International Test Conference
Optimal testing of VLSI analog circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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An all-digital technique for the measurement ofthe jitter transfer function of charge-pump phase-lockedloops is introduced. Input jitter may be generated usingone of two methods. Both rely on delta-sigma modulationto shape the unavoidable quantization noise to high frequencies.This noise is filtered by the lowpass characteristicof the device and has a minimal impact on the testresults. For response measurement, the output jitter iscompared against a threshold. As the stimulus generationand output analysis circuits are digital and do not requirecalibration, this jitter transfer function measurementscheme is highly amenable to built-in self-test. The techniquecan also be used to adaptively tune a PLL after fabrication.The validity of the scheme was verifiedexperimentally with off-the-shelf components.