A Tutorial on Built-in Self-Test. I. Principles

Authors:
Vishwani D. Agrawal;Charles R. Kime;Kewal K. Saluja
Affiliations:
-;-;-
Venue:
IEEE Design & Test
Year:
1993

Citing 11
Cited 47

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Abstract

An overview of built-in self-test (BIST) principles and practices is presented. The issues and economics underlying BIST are discussed, and the related hierarchical test structures are introduced. The fundamental BIST concepts of pattern generation and response analysis are explained. Linear feedback shift register theory is reviewed.