A Tutorial on Built-in Self-Test. I. Principles
IEEE Design & Test
| Hi-index | 754.84 |
In the testing of logic circuits, two proposed data-compression methods use the number of ones (syndrome) and the number of sequence changes (transition count). An enumeration N(m, k , t) of the number of length-m binary sequences having syndrome value k and transition count t is developed. Examination of this result reveals that the parallel compression of these two methods has small overlap in error masking. An asymptotic expression for N(m, k, t) is developed