Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
IBM Journal of Research and Development
Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Theory of Transparent BIST for RAMs
IEEE Transactions on Computers
A Tutorial on Built-in Self-Test. I. Principles
IEEE Design & Test
A Tutorial on Built-In Self-Test, Part 2: Applications
IEEE Design & Test
A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM
Proceedings of the IEEE International Test Conference on Test and Design Validity
Self-Learning Signature Analysis for Non-Volatile Memory Testing
Proceedings of the IEEE International Test Conference on Test and Design Validity
The PowerPC 603TM Microprocessor: An Array Built-In Self-Test Mechanism
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Journal of Electronic Testing: Theory and Applications
Hi-index | 14.98 |
This paper analyzes the random pattern testability of faults in the control logic of an embedded memory. We show how to compute exposure probabilities of these faults using mostly signal probability computations. We also show that the hardest memory control logic fault to detect is not necessarily the one with the lowest detection probability at the memory boundary.