Design of Crosspoint-Irredundant PLAs Using Minimal Number of Control Inputs
IEEE Transactions on Computers
Multiple Fault Detection in Fan-Out Free Circuits Using Minimal Single Fault Test Set
IEEE Transactions on Computers
A New Method for Testing Re-Programmable PLAs
Journal of Electronic Testing: Theory and Applications
A Tutorial on Built-in Self-Test. I. Principles
IEEE Design & Test
| Hi-index | 0.00 |
We propose a procedure for determining fault detection tests for single and multiple fault in combinational circuits. The stuck-at-fault model is used. By the proposed procedure all test vectors for single and multiple stuck-at-fault in combinational circuit are determined. The path sensitization method is used in the test signal propagation while test signals are defined on a four element set. The procedure can also be applied to the fault detection in programmable logic devices. We consider two-level combinational circuits which are realized by the PAL architecture and we propose a procedure for determining a test set which detects all single stuck-at-faults. As a mathematical tool, the cube theory is used.