A design for testability scheme with applications to data path synthesis
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
SAC '92 Proceedings of the 1992 ACM/SIGAPP Symposium on Applied computing: technological challenges of the 1990's
Software trustability analysis
ACM Transactions on Software Engineering and Methodology (TOSEM)
Fault Coverage and Test Length Estimation for Random Pattern Testing
IEEE Transactions on Computers - Special issue on fault-tolerant computing
A Tutorial on Built-in Self-Test. I. Principles
IEEE Design & Test
Modeling Fault Coverage of Random Test Patterns
Journal of Electronic Testing: Theory and Applications
REGISTER-TRANSFER LEVEL FAULT MODELING AND TEST EVALUATION TECHNIQUES FOR VLSI CIRCUITS
ITC '00 Proceedings of the 2000 IEEE International Test Conference
IEEE Transactions on Computers
Journal of Electronic Testing: Theory and Applications
Antirandom Test Vectors for BIST in Hardware/Software Systems
Fundamenta Informaticae
Hi-index | 14.98 |
A relation between the average fault coverage and circuit testability is developed. The statistical formulation allows computation of coverage for deterministic and random vectors. The following applications of this analysis are discussed: determination of circuit testability from fault simulation, coverage prediction from testability analysis, prediction of test length, and test generation by fault sampling.