Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
A Statistical Theory of Digital Circuit Testability
IEEE Transactions on Computers
Efficient test-point selection for scan-based BIST
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Improving the test quality for scan-based BIST using a general test application scheme
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Deterministic BIST with Partial Scan
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Altering a Pseudo-Random Bit Sequence for Scan-Based BIST
Proceedings of the IEEE International Test Conference on Test and Design Validity
Test generation costs analysis and projections
DAC '80 Proceedings of the 17th Design Automation Conference
Test point insertion based on path tracing
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
A probabilistic analysis of coverage methods
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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We present a new probabilistic fault coverage model that is accurate, simple, predictive, and easily integrated with the normal design flow of built-in self-test circuits. The parameters of the model are determined by fitting the fault simulation data obtained on an initial segment of the random test. A cost-based analysis finds the point at which to stop fault simulation, determine the parameters, and estimate fault coverage for longer test lengths. Experimental results on benchmark circuits demonstrate the effectiveness of this approach in making accurate predictions at a low computational cost. As compared to the cost of fault-simulating all the test vectors, the savings in computational time for larger circuits ranged from four to fourteen times. We also present an analysis of the mean and the variance of the fault coverage achieved by a random test of a given length. This analysis and simulation results demonstrate that while the mean coverage is determined by the distribution of the detectabilities of individual faults, the dual distribution of fault coverage of individual test vectors determines the variance.