A Statistical Theory of Digital Circuit Testability
IEEE Transactions on Computers
An Examination of Fault Exposure Ratio
IEEE Transactions on Software Engineering - Special issue on software reliability
Arithmetic Additive Generators of Pseudo-Exhaustive Test Patterns
IEEE Transactions on Computers
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Transparent random access memory testing for pattern sensitive faults
Journal of Electronic Testing: Theory and Applications
Fast Antirandom (FAR) Test Generation
HASE '98 The 3rd IEEE International Symposium on High-Assurance Systems Engineering
ATS '02 Proceedings of the 11th Asian Test Symposium
Pseudo-exhaustive word-oriented DRAM testing
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Antirandom vs. Psuedorandom Testing
ICCD '98 Proceedings of the International Conference on Computer Design
Synthesis of locally exhaustive test pattern generators
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Experimental Evaluation of Pseudorandom Test Effectiveness
EUROMICRO '98 Proceedings of the 24th Conference on EUROMICRO - Volume 1
Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing
IEEE Transactions on Computers
The Weighted Random Test-Pattern Generator
IEEE Transactions on Computers
Exhaustive Test Pattern Generation with Constant Weight Vectors
IEEE Transactions on Computers
Antirandom testing: a distance-based approach
VLSI Design
Orderly Random Testing for Both Hardware and Software
PRDC '08 Proceedings of the 2008 14th IEEE Pacific Rim International Symposium on Dependable Computing
Adaptive Random Testing: The ART of test case diversity
Journal of Systems and Software
Adaptive Random Testing by Exclusion through Test Profile
QSIC '10 Proceedings of the 2010 10th International Conference on Quality Software
Multiple distributions for biased random test patterns
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Using Coverage Information to Guide Test Case Selection in Adaptive Random Testing
COMPSACW '10 Proceedings of the 2010 IEEE 34th Annual Computer Software and Applications Conference Workshops
The coverage problem for random testing
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
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Antirandom testing is a variation of pure random testing, which is the process of generating random patterns and applying it to a system under test (both software systems and hardware systems). However, research studies have shown that pure random testing is relatively less effective at fault detection than other testing techniques. Antirandom testing improves the fault-detection capability of random testing by employing the location information of previously executed test cases. In antirandom testing we select test case such that it is as different as possible from all the previous executed test cases. Unfortunately, this method essentially requires enumeration of the input space and computation of each input pattern when used on an arbitrary set of existing test data. This avoids scale-up to large test sets and (or) long input vectors. The objective of this paper is to find a more efficient method of the test generation which does not need any computation. The key idea of proposed approach is an iterative application of the short antirandom tests where the first test vector in each iteration is generated randomly. Moreover, we propose a new metric the Maximal Minimal Hamming Distance (MMHD) which allows us to define an optimal antirandom test with restricted number of patterns. Experimental results are given to evaluate the performance of the new approach.