The coverage problem for random testing

Authors:
Yashwant K. Malaiya;Shoubao Yang
Affiliations:
Computer Science Department, Colorado State University, Fort Collins, Colorado;Computer Science Department, Colorado State University, Fort Collins, Colorado
Venue:
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Year:
1984

Citing 8
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Abstract

Random testing is frequently an attractive alternative to deterministic test generation. How to estimate the coverage obtained by random testing is an important problem. This paper considers a possible technique for combinational circuits. Random testing properties of several combinational circuits are examined.