A note on binary template matching
Pattern Recognition
Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Exhaustive and Near-Exhaustive Memory Testing Techniques and theirBIST Implementations
Journal of Electronic Testing: Theory and Applications
The art of computer programming, volume 3: (2nd ed.) sorting and searching
The art of computer programming, volume 3: (2nd ed.) sorting and searching
Fast Antirandom (FAR) Test Generation
HASE '98 The 3rd IEEE International Symposium on High-Assurance Systems Engineering
The repeated nondestructive march tests with variable address sequences
Automation and Remote Control
Antirandom testing: a distance-based approach
VLSI Design
Orderly Random Testing for Both Hardware and Software
PRDC '08 Proceedings of the 2008 14th IEEE Pacific Rim International Symposium on Dependable Computing
Iterative exhaustive pattern generation for logic testing
IBM Journal of Research and Development
Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
International Journal of Applied Mathematics and Computer Science - Selected Problems of Computer Science and Control
An Indepth Study of Mirror Adaptive Random Testing
QSIC '09 Proceedings of the 2009 Ninth International Conference on Quality Software
Adaptive Random Test Case Prioritization
ASE '09 Proceedings of the 2009 IEEE/ACM International Conference on Automated Software Engineering
Using Coverage Information to Guide Test Case Selection in Adaptive Random Testing
COMPSACW '10 Proceedings of the 2010 IEEE 34th Annual Computer Software and Applications Conference Workshops
The coverage problem for random testing
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
ASIAN'04 Proceedings of the 9th Asian Computing Science conference on Advances in Computer Science: dedicated to Jean-Louis Lassez on the Occasion of His 5th Cycle Birthday
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Random testing and its different modifications are considered. Some criteria of controlled generation of random tests are analyzed; an optimal controlled random test is synthesized on the basis of the above criteria. Finally, a universal efficiency estimate is suggested for controlled random tests, with an application to controlled random tests of small length.