Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Theory of Transparent BIST for RAMs
IEEE Transactions on Computers
Testing and testable design of high-density random-access memories
Testing and testable design of high-density random-access memories
Transparent Memory Testing for Pattern-Sensitive Faults
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Nondestructive RAM Testing by Analyzing the Output Data for Symmetry
Automation and Remote Control
Automation and Remote Control
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Random access memory testing by repeated application of march tests was examined. The sequence of addresses formed in each test phase with the constant test structure was used as a variable parameter. The method of the modified address sequences formation is proposed. As a difference measure of the modified address sequences arithmetic distance is used. The efficiency of detection of pattern sensitive faults is estimated depending on modification of the address sequences and their arithmetic distances.