Nondestructive RAM Testing by Analyzing the Output Data for Symmetry

Authors:
A. P. Zankovich;V. N. Yarmolik
Affiliations:
Belarussian State University of Informatics and Radioelectronics, Minsk, Belarus;Belarussian State University of Informatics and Radioelectronics, Minsk, Belarus
Venue:
Automation and Remote Control
Year:
2003

Citing 6
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The repeated nondestructive march tests with variable address sequences

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Abstract

For the nondestructive march memory testing based on the symmetry analysis of the read out flows of output data, consideration was given to the conditions for manifestation of the bit-stuck, transition, and coupling faults and to construction of algorithms providing their hundred-percent covering by a minimum-complexity test and its minimum-complexity hardware realization.