Towards a Uniform Notation for Memory Tests

Authors:
Ad J. van de Goor;Aad Offerman;Ivo Schanstra
Affiliations:
Section Computer Architecture & Digital Technique, Department of Electrical Engeneering, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands;Section Computer Architecture & Digital Technique, Department of Electrical Engeneering, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands;Section Computer Architecture & Digital Technique, Department of Electrical Engeneering, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands
Venue:
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Year:
1996

Citing 10
Cited 2

The C programming language

The C programming language
An overview of deterministic functional RAM chip testing

ACM Computing Surveys (CSUR)
Testing semiconductor memories: theory and practice

Testing semiconductor memories: theory and practice
LR Parsing

ACM Computing Surveys (CSUR)
Functional Testing of Semiconductor Random Access Memories

ACM Computing Surveys (CSUR)
Using March Tests to Test SRAMs

IEEE Design & Test
Built-In Self-Diagnosis for Repairable Embedded RAMs

IEEE Design & Test
An Effective BIST Scheme for Ring-Address Type FIFOs

Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Fault Location Algorithms for Repairable Embedded

Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Functional test for shifting-type FIFOs

EDTC '95 Proceedings of the 1995 European conference on Design and Test

A computer aided engineering system for memory BIST

Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Nondestructive RAM Testing by Analyzing the Output Data for Symmetry

Automation and Remote Control

Quantified Score

Hi-index	0.00

Visualization

Abstract

Historically many ways of expressing memory tests have been used; varying from special notations to the use of general purpose programming languages. A notation, originally introduced for march tests in 1990, has been adopted and extended by many researchers. This paper extends that notation, in a systematic way, to a memory test language which allows march tests, pseudo march tests (such as GALPAT) and tests involving topological neighborhoods (to cover pattern sensitive faults) to be expressed in a unified way. The syntax and semantics facilitate the specification of memory tests in a compact way and can be processed using standard tools such as LEX and YACC.