Functional test for shifting-type FIFOs

Authors:
A. J. van de Goor;I. Schanstra;Y. Zorian
Affiliations:
Delft Univ. of Technology, P.O.Box 5031, 2600 GA Delft, The Netherlands;Delft Univ. of Technology, P.O.Box 5031, 2600 GA Delft, The Netherlands;AT&T Bell Laboratories, Eng. Res. Center, P.O.Box 900, Princeton, N.J.
Venue:
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Year:
1995

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Abstract

FIFO memories impose special test problems because of their built-in addressing restrictions and access limitations. With the increasing use of FIFOs, as a stand-alone chip or as embedded macros in ASICs, generic algorithms are needed to test FIFOs. This paper addresses the problem of testing the widely available shifting-type FIFOs; it introduces specific fault models and a set of generic tests which have a test length of O(n) and can be used for the stand-alone chip as well as for the embedded macro version of the FIFO.