Functional test for shifting-type FIFOs
EDTC '95 Proceedings of the 1995 European conference on Design and Test
An Efficient BIST Method for Small Buffers
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Practical Scan Test Generation and Application for Embedded FIFOs
ITC '99 Proceedings of the 1999 IEEE International Test Conference
An effective BIST scheme for ring-address type FIFOs
ITC'94 Proceedings of the 1994 international conference on Test
An efficient fault detection algorithm for NAND flash memory
ACM SIGAPP Applied Computing Review
| Hi-index | 0.00 |