An efficient fault detection algorithm for NAND flash memory

Authors:
Tei-Wei Kuo;Po-Chun Huang;Yuan-Hao Chang;Chia-Ling Ko;Chih-Wen Hsueh
Affiliations:
National Taiwan University, Taipei, Taiwan, R.O.C.;National Taiwan University, Taipei, Taiwan, R.O.C.;National Taipei University of Technology, Taipei, Taiwan, R.O.C.;National Taiwan University, Taipei, Taiwan, R.O.C.;National Taiwan University, Taipei, Taiwan, R.O.C.
Venue:
ACM SIGAPP Applied Computing Review
Year:
2011

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Abstract

As flash memory gains its momentum in the storage market of embedded systems, existing fault detection algorithms face serious challenges due to the special characteristics of NAND flash memory and the rapid degradation of its reliability. This research proposes an efficient fault detection algorithm to detect the faults of NAND flash memory in a systematic way. Through the analysis of the testing time, the efficiency of the proposed algorithm is also evaluated and proved to be feasible.