A P1500-Compatible Programmable BIST Aapproach for the Test of Embedded Flash Memories
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Techniques for Disturb Fault Collapsing
Journal of Electronic Testing: Theory and Applications
Built-in self-repair schemes for flash memories
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
An efficient fault detection algorithm for NAND flash memory
ACM SIGAPP Applied Computing Review
Write disturbance modeling and testing for MRAM
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Flash memories are a type of non-volatile memory based on floating-gate transistors. The use of commodity and embedded flash memories are growing rapidly as we enter the system-on-chip (SOC) era. Conventional tests for flash memories are usually ad hoc-the test procedure is developed for a specific design. We propose improved March-like algorithms (i.e., March FT) for both bit-oriented and word-oriented flash memory, to cover the disturbance faults derived from the IEEE 1005 Standard, as well as conventional faults. A noval flash memory fault simulator is used to analyze and generate the test algorithms. In addition, we present BIST designs for two industrial flash memories. The area overhead is only about 3% for a medium-sized flash memory.