A reliable MTD design for MLC flash-memory storage systems

  • Authors:
  • Yuan-Hao Chang;Tei-Wei Kuo

  • Affiliations:
  • National Taipei University of Technology, Taipei, Taiwan Roc;National Taiwan University, Taipei, Taiwan Roc

  • Venue:
  • EMSOFT '10 Proceedings of the tenth ACM international conference on Embedded software
  • Year:
  • 2010

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Abstract

The reliability of flash-memory chips has dropped dramatically in recent years. In order to solve this problem, a reliable memory technology device (MTD) design is proposed to address this concern at the device driver layer so as to release the design complexity of flash-memory management software/firmware and to improve the maintainability and portability of flash management designs for existing and future products. The proposed design was evaluated through a series of experiments based on realistic traces to show that the proposed approach could significantly improve the reliability of flash memory with limited overheads.