IEEE Transactions on Computers
Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
A Novel Approach to Random Pattern Testing of Sequential Circuits
IEEE Transactions on Computers
Cellular Automata-Based Recursive Pseudoexhaustive Test Pattern Generator
IEEE Transactions on Computers
Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification
Journal of Electronic Testing: Theory and Applications
Fast Antirandom (FAR) Test Generation
HASE '98 The 3rd IEEE International Symposium on High-Assurance Systems Engineering
A Methodology to Design Efficient BIST Test Pattern Generators
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Altering a Pseudo-Random Bit Sequence for Scan-Based BIST
Proceedings of the IEEE International Test Conference on Test and Design Validity
GLFSR - A New Test Pattern Generator for Built-In Self-Test
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
An Efficient Random-like Testing
ATS '98 Proceedings of the 7th Asian Test Symposium
ATS '02 Proceedings of the 11th Asian Test Symposium
Antirandom vs. Psuedorandom Testing
ICCD '98 Proceedings of the International Conference on Computer Design
Automatic Test Generation using Checkpoint Encoding and Antirandom Testing
ISSRE '97 Proceedings of the Eighth International Symposium on Software Reliability Engineering
A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage
IOLTS '05 Proceedings of the 11th IEEE International On-Line Testing Symposium
Software-based self-testing methodology for processor cores
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Using program data-state scarcity to guide automatic test data generation
Software Quality Control
Adaptive random testing: an illusion of effectiveness?
Proceedings of the 2011 International Symposium on Software Testing and Analysis
Journal of Electronic Testing: Theory and Applications
Antirandom Test Vectors for BIST in Hardware/Software Systems
Fundamenta Informaticae
Automation and Remote Control
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Random testing requires each test to be selected randomly regardless of the tests previously applied. This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum. This spans the test vector space to the maximum extent possible for a given number of vectors. An algorithm for generating antirandom tests is presented. Compared with traditional pseudorandom testing, antirandom testing is found to be very effective when a high-fault coverage needs to be achieved with a limited number of test vectors. The superiority of the new approach is even more significant for testing bridging faults.