On the Generation of Pseudo-Deterministic Two-Patterns Test Sequence with LFSRs
EDTC '97 Proceedings of the 1997 European conference on Design and Test
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
A BIST Pattern Generator Design for Near-Perfect Fault Coverage
IEEE Transactions on Computers
EBIST: A Novel Test Generator with Built-In Fault Detection Capability
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
A seed selection procedure for LFSR-based random pattern generators
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
On concurrent detection of errors in polynomial basis multiplication
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Antirandom testing: a distance-based approach
VLSI Design
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