GLFSR - A New Test Pattern Generator for Built-In Self-Test
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Logic BIST for Large Industrial Designs: Real Issues and Case Studies
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodologies are presented. The first one guarantees all single fault/error detection and the second methodology is capable of detecting multiple faults and errors. Furthermore the proposed LFSRs do not have additional hardware over-head. Also importantly the test patterns generated have the potential to achieve superior fault coverage.