An Advanced Fault Isolation System for Digital Logic
IEEE Transactions on Computers
Analysis of Logic Circuits with Faults Using Input Signal Probabilities
IEEE Transactions on Computers
About Random Fault Detection of Combinational Networks
IEEE Transactions on Computers
Probabilistic Analysis of Random Test Generation Method for Irredundant Combinational Logic Networks
IEEE Transactions on Computers
The Weighted Random Test-Pattern Generator
IEEE Transactions on Computers
On the necessity to examine D-chains in diagnostic test generation-an example
IBM Journal of Research and Development
Adaptive random testing by balancing
Proceedings of the 2nd international workshop on Random testing: co-located with the 22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007)
IEEE Transactions on Computers
The coverage problem for random testing
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Adaptive random testing by bisection with restriction
ICFEM'05 Proceedings of the 7th international conference on Formal Methods and Software Engineering
Adaptive random testing by bisection and localization
FATES'05 Proceedings of the 5th international conference on Formal Approaches to Software Testing
Automated cookie collection testing
ACM Transactions on Software Engineering and Methodology (TOSEM)
| Hi-index | 14.98 |
A probabilistic method for deciding whether a combinational circuit should be tested by random inputs, is given. This decision is based upon certain easily observable circuit parameters, such as, the number of primary inputs, the number of levels, and the average fan in.