A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Efficiency of Random Compact Testing
IEEE Transactions on Computers
IEEE Transactions on Computers
Random-pattern coverage enhancement and diagnosis for LSSD logic self-test
IBM Journal of Research and Development
IEEE Transactions on Computers
Linear Dependencies in Linear Feedback Shift Registers
IEEE Transactions on Computers
IEEE Transactions on Computers
Fault Propagation Through Embedded Multiport Memories
IEEE Transactions on Computers
A method for generating weighted random test pattern
IBM Journal of Research and Development
IBM Journal of Research and Development
Fault coverage of a long random test sequence estimated from a short simulation
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
How Seriously Do You Take Possible-Detect Faults?
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Optimal periodic testing policy for circuit with self-testing
Computers & Mathematics with Applications
Microprocessor testing by instruction sequences derived from random patterns
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
WTPGA: a novel weighted test-pattern generation approach for VLSI built-in self test
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Circular BIST with partial scan
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Random testing for stuck-at storage cells in an embedded memory
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
| Hi-index | 14.99 |
The testing of large logic networks with random patterns is examined. Work by previous workers for single faults is extended to a class of multiple fault situations. Not only is the problem of fault detection in the presence of nonmasking multiple faults treated, but the question of distinguishing between them is also examined. It is shown that a test that merely exposes each fault has a high probability of distinguishing between the faults. The relationships between quality, diagnostic resolution, and random pattern test length are developed. The results have application to self-test schemes that use random patterns as stimuli.