Linear Dependencies in Linear Feedback Shift Registers

Authors:
C L Chen
Affiliations:
-
Venue:
IEEE Transactions on Computers
Year:
1986

Citing 7
Cited 12

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Abstract

Linear feedback shift registers have been proposed to generate test patterns for the self-test of logic networks. The probability of linear dependence among k bit positions of a subset of k bits in a maximum length shift register sequence is an outstanding problem. In this correspondence, we derive a formula for the calculation of the probability.