Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing
IEEE Transactions on Computers
Multiple Fault Testing of Large Circuits by Single Fault Test Sets
IEEE Transactions on Computers
IEEE Transactions on Computers
IEEE Transactions on Computers
Exhaustive Test Pattern Generation with Constant Weight Vectors
IEEE Transactions on Computers
Random-pattern coverage enhancement and diagnosis for LSSD logic self-test
IBM Journal of Research and Development
Condensed Linear Feedback Shift Register (LFSR) Testing A Pseudoexhaustive Test Technique
IEEE Transactions on Computers - The MIT Press scientific computation series
Linear Dependencies in Linear Feedback Shift Registers
IEEE Transactions on Computers
EDCC-3 Proceedings of the Third European Dependable Computing Conference on Dependable Computing
A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Pseudoexhaustive TPG with a Provably Low Number of LFSR Seeds
ICCD '00 Proceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors
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Logic testing of today's integrated circuits is a task of increasing difficulty as the number of circuits or transistors packed onto a single chip grows higher and higher. Exhaustive pattern testing, with adequate partitioning of logic, has been explored regarding its potential in solving the problems in test pattern generation and fault coverage. In this paper, we propose a new method of simultaneously generating exhaustive test patterns for all possible input subsets (each corresponding to an output) up tq a specified size. The method is based on the structure of linear polynomial codes and can be easily implemented by modifying existing shift-registers in an LSSD or scan path design to embody additional feedback connections. This is particularly attractive since the implementation is compatible with the approach of self-testing using pseudorandom patterns. Thus, a very reasonable strategy is to combine limited exhaustive pattern testing with pseudorandom pattern testing ini cases where complete exhaustive testing is not practical.