Linear Dependencies in Linear Feedback Shift Registers
IEEE Transactions on Computers
Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
IEEE Transactions on Computers - Special issue on fault-tolerant computing
On Linear Dependencies in Subspaces of LFSR-Generated Sequences
IEEE Transactions on Computers
Test Data Decompression for Multiple Scan Designs with Boundary Scan
IEEE Transactions on Computers
Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Combinatorial Algorithms: Theory and Practice
Combinatorial Algorithms: Theory and Practice
Automated synthesis of phase shifters for built-in self-test applications
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In experiments examining test pattern generators using LFSRs with and without phase shifters as sources of 2D stimuli, generators with phase shifters consistently achieved higher hit ratios than those without them. Moreover, a new algorithm synthesizes phase shifters, minimizes linear dependencies, and highly balances the use of generator stages.