On Linear Dependencies in Subspaces of LFSR-Generated Sequences

Authors:
Janusz Rajski;Jerzy Tyszer
Affiliations:
-;-
Venue:
IEEE Transactions on Computers
Year:
1996

Citing 5
Cited 4

Linear Dependencies in Linear Feedback Shift Registers

IEEE Transactions on Computers
Built-in test for VLSI: pseudorandom techniques

Built-in test for VLSI: pseudorandom techniques
Design considerations for parallel pseudorandom pattern generators

Journal of Electronic Testing: Theory and Applications
Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers

IEEE Transactions on Computers - Special issue on fault-tolerant computing
A Multiple Seed Linear Feedback Shift Register

IEEE Transactions on Computers

Test Data Decompression for Multiple Scan Designs with Boundary Scan

IEEE Transactions on Computers
Test volume and application time reduction through scan chain concealment

Proceedings of the 38th annual Design Automation Conference
2D Test Sequence Generators

IEEE Design & Test
Multiple-Seed TPG Structures

IEEE Transactions on Computers

Quantified Score

Hi-index	14.99

Visualization

Abstract

The probability of linear dependency in subsequences generated by linear feedback shift registers is examined. It is shown that this probability for a short subsequence, e.g., a sequence defined by the length of a scan chain, can be much higher than that for an entire m-sequence.