IEEE Transactions on Computers - Special issue on fault-tolerant computing
On Linear Dependencies in Subspaces of LFSR-Generated Sequences
IEEE Transactions on Computers
BIST Pattern Generators Using Addition and Subtraction Operations
Journal of Electronic Testing: Theory and Applications - Special issue on test synthesis
Deterministic BIST with Multiple Scan Chains
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Improving the test quality for scan-based BIST using a general test application scheme
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Application of Deterministic Logic BIST on Industrial Circuits
Journal of Electronic Testing: Theory and Applications
An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment
Journal of Electronic Testing: Theory and Applications
A Tutorial on Built-In Self-Test, Part 2: Applications
IEEE Design & Test
Test Set Embedding Based on Phase Shifters
EDCC-4 Proceedings of the 4th European Dependable Computing Conference on Dependable Computing
Deterministic BIST with multiple scan chains
ITC '98 Proceedings of the 1998 IEEE International Test Conference
An almost full-scan BIST solution-higher fault coverage and shorter test application time
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Automated synthesis of large phase shifters for built-in self-test
ITC '98 Proceedings of the 1998 IEEE International Test Conference
10.2 Design of Phase Shifters for BIST Applications
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
4.3 Bit Serial Pattern Generation and Response Compaction Using Arithmetic Functions
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Application of Deterministic Logic BIST on Industrial Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
On Accumulator-Based Bit-Serial Test Response Compaction Schemes
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
Synthesis of Pattern Generators Based on Cellular Automata with Phase Shifters
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Planar High Performance Ring Generators
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
High Performance Dense Ring Generators
IEEE Transactions on Computers
Investigating some special sequence lengths generated in an external exclusive-NOR type LFSR
Computers and Electrical Engineering
GLFSR: a new test pattern generator for built-in-self-test
ITC'94 Proceedings of the 1994 international conference on Test
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