Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators

Authors:
Grzegorz Mrugalski;Jerzy Tyszer;Janusz Rajski
Affiliations:
-;-;-
Venue:
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Year:
2000

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2D Test Sequence Generators

IEEE Design & Test

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Abstract

Probability of obtaining desired test patterns in subsequences generated by two-dimensional test pattern generators is examined. Various architectures of generators comprised of linear feedback shift registers, cellular automata and associated phase shifters are thoroughly investigated. Two new algorithms that can be employed to synthesize phase shifters minimizing linear dependencies and assuring highly balanced usage of all generator stages are also introduced.