Test Vector Encodin Usin Partial LFSR Reseedin

Authors:
C. V. Krishna;Abhijit Jas;Nur A. Touba
Affiliations:
-;-;-
Venue:
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Year:
2001

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Abstract

A new form of LFSR reseeding that provide higherencoding efficiency and hence greater reduction in testdata torage requirement is described. Previous formof LFSR reseeding have been tatic (i.e., test generation istopped and the seed is loaded at one time) and haverequired full reseeding (i.e.,n=r bit are used for an r-bitLFSR). The new form of LFSR reseeding proposed here isdynamic (i.e.,the seed is incrementally modified whiletest generation proceed) and allow partial reseeding(i.e.n