Linear Dependencies in Linear Feedback Shift Registers
IEEE Transactions on Computers
IEEE Transactions on Computers - Special issue on fault-tolerant computing
Test set compaction algorithms for combinational circuits
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Test Data Decompression for Multiple Scan Designs with Boundary Scan
IEEE Transactions on Computers
Test volume and application time reduction through scan chain concealment
Proceedings of the 38th annual Design Automation Conference
A case study on the implementation of the Illinois Scan Architecture
Proceedings of the IEEE International Test Conference 2001
Test vector decompression via cyclical scan chains and its application to testing core-based designs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test vector encoding using partial LFSR reseeding
Proceedings of the IEEE International Test Conference 2001
Efficient compression and application of deterministic patterns in a logic BIST architecture
Proceedings of the 40th annual Design Automation Conference
Scan Vector Compression/Decompression Using Statistical Coding
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test Data Compression Using Dictionaries with Fixed-Length Indices
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Efficient Seed Utilization for Reseeding based Compression
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
A MIXED MODE BIST SCHEME BASED ON RESEEDING OF FOLDING COUNTERS
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Packet-Based Input Test Data Compression Techniques
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Embedded Deterministic Test for Low-Cost Manufacturing Test
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Multiscan-Based Test Compression and Hardware Decompression Using LZ77
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Reducing Test Application Time Through Test Data Mutation Encoding
Proceedings of the conference on Design, automation and test in Europe
Proceedings of the conference on Design, automation and test in Europe
Decompression of test data using variable-length seed LFSRs
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Test data compression using dictionaries with selective entries and fixed-length indices
ACM Transactions on Design Automation of Electronic Systems (TODAES)
System-on-a-chip test-data compression and decompression architectures based on Golomb codes
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Using MUXs Network to Hide Bunches of Scan Chains
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume
ISVLSI '05 Proceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design
Survey of Test Vector Compression Techniques
IEEE Design & Test
A logic built-in self-test architecture that reuses manufacturing compressed scan test patterns
Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes
Correlation-based rectangular encoding
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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In this paper we describe a method to combine dictionary coding and partial LFSR reseeding to improve the ompression efficiency for test data compression. We also present a fast matrix calculation method which significantly reduces the computation time to find a solution for partial LFSR reseeding. Experimental results on ISCAS89 benchmark circuits show that our approach is better than either dictionary coding or LFSR reseeding, and outperforms several test data compression methods proposed recently.