A MIXED MODE BIST SCHEME BASED ON RESEEDING OF FOLDING COUNTERS

Authors:
Sybille Hellebrand;Hua-Guo Liang;Hans-Joachim Wunderlich
Affiliations:
-;-;-
Venue:
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Year:
2000

Citing 12
Cited 25

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Abstract

In this paper a new scheme for deterministic andmixed mode scan-based BIST is presented. It relies on anew type of test pattern generator which resembles a programmable Johnson counter and is called foldingcounter. Both the theoretical background and practicalalgorithms are presented to characterize a set of deterministictest cubes by a reasonably small number of seeds for a folding counter. Combined with classical approachesfor test width compression and with pseudorandompattern generation these new techniques providean efficient and flexible solution for scan-based BIST.Experimental results show that the proposed schemeoutperforms previously published approaches based onthe reseeding of LFSRs or Johnson counters.