Hybrid BIST Based on Repeating Sequences and Cluster Analysis

Authors:
Lei Li;Krishnendu Chakrabarty
Affiliations:
Freescale Semiconductor, Inc., Austin, TX;Duke University, Durham, NC
Venue:
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Year:
2005

Citing 16
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Abstract

We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use cluster analysis for sequence extraction, and encode deterministic patterns on the basis of the stored sequences. Experimental results for the ISCAS-89 benchmark circuits show that the proposed approach often requires less on-chip storage and test data volume than other recent BIST methods.