Embedded Deterministic Test for Low-Cost Manufacturing Test

Authors:
Januz Rajki;Jerzy Tyzer;Mark Kassab;Nilanjan Mukherjee;Rob Thompson;Kun-Han Tsai;Andre Hertwig;Nagesh Tamarapalli;Grzegorz Mrugalski;Geir Eide;Jun Qian
Affiliations:
-;-;-;-;-;-;-;-;-;-;-
Venue:
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Year:
2002

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Abstract

This paper introduces Embedded Deterministic Test (EDT) technology, which reduces manufacturing test cost by providing one to two orders of magnitude reduction in scan test data volume and scan test time. The EDT architecture, the compression algorithm, design flow, experimental results, and silicon implementation are presented.