Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
IEEE Transactions on Computers - Special issue on fault-tolerant computing
Test Data Decompression for Multiple Scan Designs with Boundary Scan
IEEE Transactions on Computers
Integration, the VLSI Journal - Special issue on VLSI testing
Two-Dimensional Test Data Decompressor for Multiple Scan Designs
Proceedings of the IEEE International Test Conference on Test and Design Validity
Two-dimensional test data compression for scan-based deterministic BIST
Proceedings of the IEEE International Test Conference 2001
Test vector encoding using partial LFSR reseeding
Proceedings of the IEEE International Test Conference 2001
A ROMless LFSR Reseeding Scheme for Scan-based BIST
ATS '02 Proceedings of the 11th Asian Test Symposium
Application of Deterministic Logic BIST on Industrial Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Embedded Deterministic Test for Low-Cost Manufacturing Test
ITC '02 Proceedings of the 2002 IEEE International Test Conference
An Efficient Seeds Selection Method for LFSR-based Test-per-clock BIST
ISQED '02 Proceedings of the 3rd International Symposium on Quality Electronic Design
Decompression of test data using variable-length seed LFSRs
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Gauss-elimination-based generation of multiple seed-polynomial pairs for LFSR
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Bit-fixing in pseudorandom sequences for scan BIST
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan chain in different test phases. The LFSR generates the same state sequence in all phases, keeping that way the implementation cost low. Also, a dynamic reseeding scheme is adopted for further reducing the required hardware overhead. A seed-selection algorithm is moreover presented that, taking advantage of the multi-phase architecture, manages to reduce the number of the required seeds for achieving complete (100 %) fault coverage. Experimental results demonstrate the superiority of the proposed LFSR reseeding approach over the already known reseeding techniques.