Reduction of SOC test data volume, scan power and testing time using alternating run-length codes
Proceedings of the 39th annual Design Automation Conference
Scan Vector Compression/Decompression Using Statistical Coding
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Embedded Deterministic Test for Low-Cost Manufacturing Test
ITC '02 Proceedings of the 2002 IEEE International Test Conference
A SmartBIST Variant with Guaranteed Encoding
ATS '01 Proceedings of the 10th Asian Test Symposium
Proceedings of the conference on Design, automation and test in Europe
IEEE Transactions on Computers
RL-huffman encoding for test compression and power reduction in scan applications
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Journal of Electronic Testing: Theory and Applications
Survey of Test Vector Compression Techniques
IEEE Design & Test
Test Data Compression by Spilt-VIHC (SVIHC)
ICCTA '07 Proceedings of the International Conference on Computing: Theory and Applications
Optimal Selective Huffman Coding for Test-Data Compression
IEEE Transactions on Computers
Multilevel-Huffman test-data compression for IP cores with multiple scan chains
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Survey of Test Data Compression Technique Emphasizing Code Based Schemes
DSD '09 Proceedings of the 2009 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools
Variable-length input Huffman coding for system-on-a-chip test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
An efficient test vector compression scheme using selective Huffman coding
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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A compression-decompression scheme, Modified Selective Huffman (MS-Huffman) scheme based on Huffman code is proposed in this paper. This scheme aims at optimization of the parameters that influence the test cost reduction: the compression ratio, on-chip decoder area overhead and overall test application time. Theoretically, it is proved that the proposed scheme gives the better test data compression compared to very recently proposed encoding schemes for any test set. It is clearly demonstrated with a large number of experimental results that the proposed scheme improves the test data compression, reduces overall test application time and on-chip area overhead compared to other Huffman code based schemes.