Usha Sandeep Mehta;K. S. Dasgupta;N. M. Devashrayee
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Run-length-based test data compression techniques: how far from entropy and power bounds?—a survey
VLSI Design
Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead
Journal of Electronic Testing: Theory and Applications
Analysis of test data compression techniques emphasizing statistical coding schemes
Proceedings of the International Conference & Workshop on Emerging Trends in Technology