DFT for High-Quality Low Cost Manufacturing Test
ATS '01 Proceedings of the 10th Asian Test Symposium
Towards a Standard for Embedded Core Test: An Example
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Test Data Compression by Spilt-VIHC (SVIHC)
ICCTA '07 Proceedings of the International Conference on Computing: Theory and Applications
Optimal Selective Huffman Coding for Test-Data Compression
IEEE Transactions on Computers
Survey of Test Data Compression Technique Emphasizing Code Based Schemes
DSD '09 Proceedings of the 2009 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools
Variable-length input Huffman coding for system-on-a-chip test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
An efficient test vector compression scheme using selective Huffman coding
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper it is observed that the test data compression environment (TDCE) parameters: compression ratio and area overhead of code based data compression techniques in statistical method like Huffman coding, selective Huffman coding, optimal Huffman coding, variable length input Huffman coding(VIHC) and split-VIHC and conclude that split VIHC method is better for compression ratio point of view and selective and optimal Huffman are better for area overhead point of view.