Towards a Standard for Embedded Core Test: An Example

Authors:
Erik Jan Marinissen;Yervant Zorian;Rohit Kapur;Tony Taylor;Lee Whetsel
Affiliations:
-;-;-;-;-
Venue:
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Year:
1999

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Abstract

Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 Standard for Embedded Core Test(SECT) is a standard-under-development that aims at improving ease of reuse and facilitating interoperability with respect to the test ofsuch core-based ICs, especially if they contain cores from different sources. This paper briefly describes IEEE P1500, and illustratesthrough a simplified example its dual compliance concept, its Scalable Hardware Architecture, and its Core Test Language. Note that thispaper provides a preliminary, unapproved view on IEEE P1500. The standard is still under development, and this paper only reflects theview of five active participants of the standardization committee on its current status.