IEEE Spectrum
Introducing Core-Based System Design
IEEE Design & Test
A structured test re-use methodology for core-based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Testing embedded-core based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A structured and scalable mechanism for test access to embedded reusable cores
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Towards a Standard for Embedded Core Test: An Example
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Testing Reusable IP - A Case Study
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Testing TAPed cores and wrapped cores with the same test access mechanism
Proceedings of the conference on Design, automation and test in Europe
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing
Journal of Electronic Testing: Theory and Applications
On Using IEEE P1500 SECT for Test Plug-n-Play
ITC '00 Proceedings of the 2000 IEEE International Test Conference
IEEE Transactions on Computers
Searching for Global Test Costs Optimization in Core-Based Systems
Journal of Electronic Testing: Theory and Applications
STEAC: a platform for automatic SOC test integration
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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