IEEE Spectrum
Test Requirements for Embedded Core-Based Systems and IEEE P1500
Proceedings of the IEEE International Test Conference
DAC '98 Proceedings of the 35th annual Design Automation Conference
Analysis of emerging core-based design lifecycle
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
The case for a configure-and-execute paradigm
CODES '99 Proceedings of the seventh international workshop on Hardware/software codesign
A low power hardware/software partitioning approach for core-based embedded systems
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
CODES '00 Proceedings of the eighth international workshop on Hardware/software codesign
System chip test: how will it impact your design?
Proceedings of the 37th Annual Design Automation Conference
Interface and cache power exploration for core-based embedded system design
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
DATE '00 Proceedings of the conference on Design, automation and test in Europe
CAS-BUS: a scalable and reconfigurable test access mechanisms for systems on a chip
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Fast cache and bus power estimation for parameterized system-on-a-chip design
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Embedded tutorial: TRP: integrating embedded test and ATE
Proceedings of the conference on Design, automation and test in Europe
A hybrid approach for core-based system-level power modeling
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
A mapping algorithm for computer-assisted exploration in the design of embedded systems
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Proceedings of the 38th annual Design Automation Conference
Soft-cores generation by instruction set analysis
Proceedings of the 14th international symposium on Systems synthesis
Embedded test control schemes for compression in SOCs
Proceedings of the 39th annual Design Automation Conference
Propagating constants past software to hardware peripherals in fixed-application embedded systems
ACM SIGARCH Computer Architecture News - Special Issue: PACT 2001 workshops
Test of future system-on-chips
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
On IEEE P1500's Standard for Embedded Core Test
Journal of Electronic Testing: Theory and Applications
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs
Journal of Electronic Testing: Theory and Applications
On-Chip Clock Faults' Detector
Journal of Electronic Testing: Theory and Applications
Using a Soft Core in a SoC Design: Experiences with picoJava
IEEE Design & Test
Design Methodology for a Large Communication Chip
IEEE Design & Test
System-on-Chip Testability Using LSSD Scan Structures
IEEE Design & Test
Generating Reliable Embedded Processors
IEEE Micro
Modular logic built-in self-test for IP cores
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Testing embedded-core based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Formal verification of the FPGA cores
Nordic Journal of Computing
Test-model based hierarchical DFT synthesis
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Benefits of a SoC-Specific Test Methodology
IEEE Design & Test
Formal Verification of Reconfigurable Cores
FCCM '99 Proceedings of the Seventh Annual IEEE Symposium on Field-Programmable Custom Computing Machines
FCCM '00 Proceedings of the 2000 IEEE Symposium on Field-Programmable Custom Computing Machines
On Using IEEE P1500 SECT for Test Plug-n-Play
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A Framework to evaluate Test Tradeoffs in Embedded Core Based Systems-Case Study on TT's TMS320C27xx
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Test Requirements for Embedded Core-based Systems and IEEE P1500
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Synthesis Experiments and Performance Metrics for Evaluating the Quality of IP Blocks and Megacells
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check
Journal of Electronic Testing: Theory and Applications
Towards a Standard for Embedded Core Test: An Example
ITC '99 Proceedings of the 1999 IEEE International Test Conference
SOC test architecture design for efficient utilization of test bandwidth
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Propagating constants past software to hardware peripherals on fixed-application embedded systems
Compilers and operating systems for low power
Evaluation of heuristic techniques for test vector ordering
Proceedings of the 14th ACM Great Lakes symposium on VLSI
A New FPGA for DSP Applications Integrating BIST Capabilities
Journal of Electronic Testing: Theory and Applications
HERMES: an infrastructure for low area overhead packet-switching networks on chip
Integration, the VLSI Journal - Special issue: Networks on chip and reconfigurable fabrics
Power-Aware Test Planning in the Early System-on-Chip Design Exploration Process
IEEE Transactions on Computers
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
System-Level Design Methodology with Direct Execution For Multiprocessors on SoPC
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hardware platform design decisions in embedded systems: a systematic teaching approach
ACM SIGBED Review - Special issues on the second workshop on embedded system education (WESE)
EURASIP Journal on Applied Signal Processing
Synthesis of object-oriented descriptions modeled at functional-level
ICECS'03 Proceedings of the 2nd WSEAS International Conference on Electronics, Control and Signal Processing
Secure Ethernet Point-to-Point Links for Autonomous Electronic Ballot Boxes
ATC '08 Proceedings of the 5th international conference on Autonomic and Trusted Computing
The efficient TAM design for core-based SOCs testing
WSEAS Transactions on Circuits and Systems
An efficient scheduling algorithm based on multi-frequency tam for SOC testing
WSEAS Transactions on Circuits and Systems
IEEE standard 1500 compliance verification for embedded cores
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Reliable And Secure Chip Level Communication By Residue Number System Code
Journal of Integrated Design & Process Science
Concept-based partitioning for large multidomain multifunctional embedded systems
ACM Transactions on Design Automation of Electronic Systems (TODAES)
On-line error detection and fast recover techniques for dependable embedded processors
On-line error detection and fast recover techniques for dependable embedded processors
Role-centered design for evolution
ECBS'99 Proceedings of the 1999 IEEE conference on Engineering of computer-based systems
Hardware/software specification, design and test using a system level approach
SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design
Increasing analog programmability in SoCs
IPDPS'06 Proceedings of the 20th international conference on Parallel and distributed processing
I2CSec: A secure serial Chip-to-Chip communication protocol
Journal of Systems Architecture: the EUROMICRO Journal
Design methodology for multifunction vehicle bus devices
ICOSSE'06 Proceedings of the 5th WSEAS international conference on System science and simulation in engineering
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Core-based designs represent a special challenge in almost all aspects of circuit and system design because of the requirements to integrate diverse components with little or no modifications to the individual block or core cells. Tools and methodologies are needed for design, validation and test of these systems. This paper outlines issues related to the core design, test and use.