Formalized three-layer system-level reuse model and methodology for embedded data-dominated applications

  • Authors:
  • F. Vermeulen;F. Catthor;D. Verkest;H. DeMan

  • Affiliations:
  • IMEC, Kapeldreef 75, Leuven, Belgium and Katholieke Univ., Leuven;IMEC, Kapeldreef 75, Leuven, Belgium and Katholieke Univ., Leuven;IMEC, Kapeldreef 75, Leuven, Belgium;IMEC, Kapeldreef 75, Leuven, Belgium and Katholieke Univ., Leuven

  • Venue:
  • DATE '00 Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 2000

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Abstract