A fast and low cost testing technique for core-based system-on-chip
DAC '98 Proceedings of the 35th annual Design Automation Conference
DAC '98 Proceedings of the 35th annual Design Automation Conference
Path delay fault testing of ICs with embedded intellectual property blocks
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Processor-programmable memory BIST for bus-connected embedded memories
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Optimal test access architectures for system-on-a-chip
ACM Transactions on Design Automation of Electronic Systems (TODAES)
On IEEE P1500's Standard for Embedded Core Test
Journal of Electronic Testing: Theory and Applications
On Concurrent Test of Core-Based SOC Design
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Introducing Core-Based System Design
IEEE Design & Test
System-on-Chip Testability Using LSSD Scan Structures
IEEE Design & Test
A structured test re-use methodology for core-based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Testing embedded-core based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test vector decompression via cyclical scan chains and its application to testing core-based designs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Scan Vector Compression/Decompression Using Statistical Coding
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Space and Time Compaction Schemes for Embedded Cores
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Towards a Standard for Embedded Core Test: An Example
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Testing a System-On-a-Chip with Embedded Microprocessor
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Design of reconfigurable access wrappers for embedded core based SoC test
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
A New FPGA for DSP Applications Integrating BIST Capabilities
Journal of Electronic Testing: Theory and Applications
Reusing an on-chip network for the test of core-based systems
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Evaluation of Error-Resilience for Reliable Compression of Test Data
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Two dimensional reordering of functional test data for compression by ATE
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Enhancing error resilience for reliable compression of VLSI test data
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Application of Arithmetic Coding to Compression of VLSI Test Data
IEEE Transactions on Computers
A new design-for-test technique for reducing SOC test time
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
A concurrent testing method for NoC switches
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Test environment for embedded cores-based system-on-chip (soc): development and methodologies
MIC'06 Proceedings of the 25th IASTED international conference on Modeling, indentification, and control
On reliable modular testing with vulnerable test access mechanisms
Proceedings of the 45th annual Design Automation Conference
The efficient TAM design for core-based SOCs testing
WSEAS Transactions on Circuits and Systems
An efficient scheduling algorithm based on multi-frequency tam for SOC testing
WSEAS Transactions on Circuits and Systems
IEEE standard 1500 compliance verification for embedded cores
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Deterministic test vector compression / decompression using an embedded processor
EDCC'05 Proceedings of the 5th European conference on Dependable Computing
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