Test set compaction algorithms for combinational circuits
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Microprocessor based testing for core-based system on chip
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Deterministic Built-in Pattern Generation for Sequential Circuits
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Mixed-Mode BIST Using Embedded Processors
Proceedings of the IEEE International Test Conference on Test and Design Validity
Test Requirements for Embedded Core-Based Systems and IEEE P1500
Proceedings of the IEEE International Test Conference
Test vector decompression via cyclical scan chains and its application to testing core-based designs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Accumulator based deterministic BIST
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Scan Vector Compression/Decompression Using Statistical Coding
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test Data Compression for System-on-a-Chip Using Golomb Codes
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Power Driven Chaining of Flip-Flops in Scan Architectures
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Scan Power Reduction Through Test Data Transition Frequency Analysis
ITC '02 Proceedings of the 2002 IEEE International Test Conference
A SmartBIST Variant with Guaranteed Encoding
ATS '01 Proceedings of the 10th Asian Test Symposium
Proceedings of the conference on Design, automation and test in Europe
Testing a System-On-a-Chip with Embedded Microprocessor
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IEEE Transactions on Computers
IEEE Transactions on Computers
System-on-a-chip test-data compression and decompression architectures based on Golomb codes
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
An efficient test vector compression scheme using selective Huffman coding
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Hi-index | 0.00 |
Test data compression and on-chip decompression using an embedded processor has already been proposed for test data volume and test time reduction as well as for use of slower testers without decreasing test quality. On the other hand, scan cell reordering methods have been proposed to overcome the problem of high average power dissipation during scan based external testing. In this paper we propose a scan cell ordering based test vector compression method, which reduces test data volume up to 87.3%. The decompression of the test data is based on the use of an embedded processor.