Design of Routing-Constrained Low Power Scan Chains
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Power-Driven Routing-Constrained Scan Chain Design
Journal of Electronic Testing: Theory and Applications
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Journal of Electronic Testing: Theory and Applications
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ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Journal of Electronic Testing: Theory and Applications
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EDCC'05 Proceedings of the 5th European conference on Dependable Computing
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Power consumption during scan testing is becoming a primary concern. In this paper, we present a novel approach for scan cell ordering which significantly reduces the power consumed during scan testing. The proposed approach is based on the use of a two-step heuristic procedure that can be exploited by any chip layout program during scan flip-flops placement and routing. The proposed approach works for any conventional scan design and offers numerous advantages compared with existing low power scan techniques. Reductions of average and peak power consumption during scan testing are up to 58% and 24% respectively for experimented ISCAS benchmark circuits.