Power-Driven Routing-Constrained Scan Chain Design

Authors:
Y. Bonhomme;P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch
Affiliations:
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, UMR 5506 Université Montpellier II/CNRS, rue Ada, France 34392;Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, UMR 5506 Université Montpellier II/CNRS, rue Ada, France 34392;Synopsys, Inc., Mountain View, USA 94043-4033;Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, UMR 5506 Université Montpellier II/CNRS, rue Ada, France 34392;Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, UMR 5506 Université Montpellier II/CNRS, rue Ada, France 34392
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2004

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Abstract

Scan-based architectures, though widely used in modern designs, are expensive in power consumption. In this paper, we present a new technique that allows to design power-optimized scan chains under a given routing constraint. The proposed technique is a three-phase process based on clustering and reordering of scan cells in the design. It allows to reduce average power consumption during scan testing. Owing to this technique, short scan connections in scan chains are guaranteed and congestion problems in the design are avoided.